Genetic Defect Based March Test Generation for SRAM
نویسندگان
چکیده
The continuos shrinking of semiconductor’s nodes makes semiconductor memories increasingly prone to electrical defects tightly related to the internal structure of the memory. Exploring the e↵ect of fabrication defects in future technologies, and identifying new classes of functional fault models with their corresponding test sequences, is a time consuming task up to now mainly performed by hand. This paper proposes a new approach to automate this procedure exploiting a dedicated genetic algorithm.
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